1 February 2000 Scattering loss measurements of evaporated slab waveguides of SiO2 and NdF3 using a prism coupler and angle-limited integrated scattering
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Optical Engineering, 39(2), (2000). doi:10.1117/1.602395
Abstract
A method for finding the attenuation coefficient of a planar or channel waveguide is described. Results for SiO2 and NdF3 waveguides were obtained, showing that the latter presents better attenuation characteristics. The influence of the prism shape on the measurements was also tested and found to result in variations in the measured attenuation coefficient. Two different locations of the waveguides were selected for the coupling, and again variations occurred, suggesting irregular thickness of the thin films. The method uses concepts based on the angle- limited integrated scattering technique and also on the well-known prism coupling method. It may be possible to make the system fully automatic.
Juan Bautista Hurtado-Ramos, Orestes Nicholas Stavroudis, G. Gomez-Rosas, Haiming Wang, "Scattering loss measurements of evaporated slab waveguides of SiO2 and NdF3 using a prism coupler and angle-limited integrated scattering," Optical Engineering 39(2), (1 February 2000). http://dx.doi.org/10.1117/1.602395
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KEYWORDS
Waveguides

Prisms

Signal attenuation

Scattering

Light scattering

Thin films

Sensors

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