1 June 2000 High reflectivity measurements using the beat frequency of longitudinal modes of external cavity semiconductor lasers
Author Affiliations +
Optical Engineering, 39(6), (2000). doi:10.1117/1.602533
Abstract
The longitudinal mode spacing of an external cavity semiconductor laser is dramatically reduced if a high-reflectivity etalon is inserted in the external cavity. By measuring the reduction in the longitudinal mode beat frequency using a microwave spectrum analyzer, a quick and precise method for determining the coating reflectivity is demonstrated.
J. Eom, Chin B. Su, "High reflectivity measurements using the beat frequency of longitudinal modes of external cavity semiconductor lasers," Optical Engineering 39(6), (1 June 2000). http://dx.doi.org/10.1117/1.602533
JOURNAL ARTICLE
4 PAGES


SHARE
KEYWORDS
Reflectivity

Semiconductor lasers

Sensors

Coating

Diodes

Spectrum analysis

Microwave radiation

Back to Top