1 June 2000 High reflectivity measurements using the beat frequency of longitudinal modes of external cavity semiconductor lasers
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Abstract
The longitudinal mode spacing of an external cavity semiconductor laser is dramatically reduced if a high-reflectivity etalon is inserted in the external cavity. By measuring the reduction in the longitudinal mode beat frequency using a microwave spectrum analyzer, a quick and precise method for determining the coating reflectivity is demonstrated.
J. Eom, J. Eom, Chin B. Su, Chin B. Su, } "High reflectivity measurements using the beat frequency of longitudinal modes of external cavity semiconductor lasers," Optical Engineering 39(6), (1 June 2000). https://doi.org/10.1117/1.602533 . Submission:
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