1 September 2000 Shear-force, constant-height, and constant-intensity imaging in scanning near-field optical microscopy with s- and p-polarized incident light
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Optical Engineering, 39(9), (2000). doi:10.1117/1.1287324
Abstract
We present a numerical comparison between shear-force, constant-height, and constant-intensity images in scanning near-field optical microscopy. We demonstrate the general difference between the three imaging modes. Two types of incident light are tested, with polarization perpendicular and parallel to the mean plane of the surface. Merits and demerits of the three images are discussed.
Mufei Xiao, Xin Chen, "Shear-force, constant-height, and constant-intensity imaging in scanning near-field optical microscopy with s- and p-polarized incident light," Optical Engineering 39(9), (1 September 2000). http://dx.doi.org/10.1117/1.1287324
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KEYWORDS
Near field scanning optical microscopy

Optical spheres

Near field

Near field optics

Optical microscopy

Polarization

Silver

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