Spectral effects of sampling a continuous-scan Fourier transform spectrometer with a capacitive transimpedance amplifier (CTIA)

W. Todd Hurt

doi:10.1117/1.1385336

1 July 2001 Spectral effects of sampling a continuous-scan Fourier transform spectrometer with a capacitive transimpedance amplifier (CTIA)

W. Todd Hurt

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Optical Engineering, Vol. 40, Issue 7, (July 2001). https://doi.org/10.1117/1.1385336

In a Michelson interferometer, an incident beam of light ~typically at infrared wavelengths! is split into two beams that travel different distances in the device. Because of the difference in path length (x), there is a phase difference between the two beams.

©(2001) Society of Photo-Optical Instrumentation Engineers (SPIE)

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W. Todd Hurt "Spectral effects of sampling a continuous-scan Fourier transform spectrometer with a capacitive transimpedance amplifier (CTIA)," Optical Engineering 40(7), (1 July 2001). https://doi.org/10.1117/1.1385336

Published: 1 July 2001

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