1 October 2001 Surface imperfections: specimen measurement by microscope and digital camera
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Abstract
An existing design of a microscope image comparator (MIC) for the measurement of surface imperfections, referenced in International Organisation for Standardization (ISO) 10110-7:1996, is judged too costly for use by small companies manufacturing optical components. A simple stripped-down version of the MlC using components recently made available in most laboratories is described. The use of the instrument is demonstrated by measurement of imperfections on two samples of scratch and dig paddle.
© (2001) Society of Photo-Optical Instrumentation Engineers (SPIE)
Lionel R. Baker, Lionel R. Baker, } "Surface imperfections: specimen measurement by microscope and digital camera," Optical Engineering 40(10), (1 October 2001). https://doi.org/10.1117/1.1405159 . Submission:
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