1 November 2001 Comparative study of wavelet thresholding methods for denoising electronic speckle pattern interferometry fringes
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Optical Engineering, 40(11), (2001). doi:10.1117/1.1412616
Abstract
This paper presents a comparative study of different thresholding methods for speckle noise reduction in electronic speckle pattern interferometry fringes using several wavelet bases. An approach based on the removal of the wavelet subbands of the transformed image is presented. The performance of this method is analyzed and compared with the results obtained with the denoising techniques that use wavelet shrinkage. It is shown that the wavelet subband removal method reduces speckle noise and maintains image features more effectively than the wavelet shrinkage techniques based on soft and hard thresholding.
Alejandro Federico, Guillermo H. Kaufmann, "Comparative study of wavelet thresholding methods for denoising electronic speckle pattern interferometry fringes," Optical Engineering 40(11), (1 November 2001). http://dx.doi.org/10.1117/1.1412616
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KEYWORDS
Wavelets

Speckle

Image filtering

Fringe analysis

Speckle pattern

Denoising

Linear filtering

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