1 November 2001 Optoelectronic hidden grids and moire patterns: basics and applications in distance measurement
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Optical Engineering, 40(11), (2001). doi:10.1117/1.1403452
Abstract
Moire fringes are visually observed when two 2-D implicit grids are superposed and rotated. We introduce two innovations in the broad field of moiré. The first calls attention to hidden or implicit grids from the photocopying process that are also used to produce moire patterns. This method of moire pattern production is extended to hidden grids optoelectronically generated by digitizing TV-CCD images. Our second innovation is a proposed application of this type of moire pattern to measure distances.
Mario Garavaglia, Anibal P. Laquidara, "Optoelectronic hidden grids and moire patterns: basics and applications in distance measurement," Optical Engineering 40(11), (1 November 2001). http://dx.doi.org/10.1117/1.1403452
JOURNAL ARTICLE
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KEYWORDS
Distance measurement

Optoelectronics

Transparency

Photography

Cameras

Image processing

Superposition

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