1 December 2001 Identification of primary aberrations on a lateral shearing interferogram of optical components using neural network
Author Affiliations +
Optical Engineering, 40(12), (2001). doi:10.1117/1.1418223
Abstract
A method is proposed for the identification of primary aberrations with a single image of a lateral shearing interferogram of optical components, obtained from a monochromatic laser source, using a neural network. The neural network is used to illustrate the features of the sampled interferograms and identify the primary aberrations of the other interferograms by means of its excellence in interpolation and extrapolation. Analysis of the pattern is performed to find the proper features to teach the neural network in less time. Simulations are performed to verify the suggested method.
Tae-Seok Yang, Junho Oh, "Identification of primary aberrations on a lateral shearing interferogram of optical components using neural network," Optical Engineering 40(12), (1 December 2001). http://dx.doi.org/10.1117/1.1418223
JOURNAL ARTICLE
9 PAGES


SHARE
KEYWORDS
Neural networks

Monochromatic aberrations

Wavefronts

Optical components

Feature extraction

Optical engineering

Interferometers

RELATED CONTENT


Back to Top