1 March 2001 Threshold characteristics of 1.55 um InGaAs/InGaAsP strain-compensated quantum well lasers with zero net strain
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Abstract
Investigations are performed for threshold characteristics of 1.55 ?m InGaAs/InGaAsP strain-compensated quantum well lasers with zero net strain. The computed results show that certain relations exist among the well width, cavity length, intrinsic loss and facet reflectivity for realization of 1.55 ?m wavelength emission. These parameters affect the threshold gain, threshold carrier density and threshold current density. A minimum cavity length exists for a single quantum well laser, near which the threshold carrier density and threshold current density become very large.
Chunsheng Ma, Lijun Wang, Shiyong Liu, "Threshold characteristics of 1.55 um InGaAs/InGaAsP strain-compensated quantum well lasers with zero net strain," Optical Engineering 40(3), (1 March 2001). https://doi.org/10.1117/1.1346582
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