1 May 2001 Influence of a general small inclination on the measurement in Talbot interferometry
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Optical Engineering, 40(5), (2001). doi:10.1117/1.1361105
Abstract
The effects of a general small inclination between the two grating planes on the moire fringes in Talbot interferometry under illumination with a plane wave are studied. The inclination is generated by rotating the beamsplitter grating through two small angles around the two perpendicular axes in the grating plane, making an arbitrary angle with the line direction of the grating. Some simple judgement and adjustment methods for the inclination are presented. The results obtained by theoretical analysis have been verified by experiments.
Qian Liu, Ryoji Ohba, "Influence of a general small inclination on the measurement in Talbot interferometry," Optical Engineering 40(5), (1 May 2001). http://dx.doi.org/10.1117/1.1361105
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KEYWORDS
Interferometry

Beam splitters

Optical engineering

Transmittance

Diffraction gratings

Sensors

Spatial frequencies

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