1 June 2001 Measurements of laser diode astigmatism using the beam-line method
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Optical Engineering, 40(6), (2001). doi:10.1117/1.1369596
Abstract
We propose a novel method to measure the astigmatism of laser diodes that is based solely on power measurements and does not require the use of any imaging system. Experimental realization of this method resulted in a sensitive measuring technique. Using it, a linear dependence of astigmatism change on drive current is demonstrated for commercial index-guided laser structures. The proposed method is believed to be highly adaptable to any experimental environment. Its advantages over currently employed methods are discussed.
Yakov S. Sidorin, Roland V. Shack, "Measurements of laser diode astigmatism using the beam-line method," Optical Engineering 40(6), (1 June 2001). http://dx.doi.org/10.1117/1.1369596
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KEYWORDS
Monochromatic aberrations

Semiconductor lasers

Gaussian beams

Imaging systems

Beam analyzers

Calibration

Optical engineering

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