1 July 2001 Shadow moire profilometry by frequency sweeping
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Optical Engineering, 40(7), (2001). doi:10.1117/1.1385170
Abstract
A frequency-sweeping technique is proposed to measure the shape of objects with discontinuous height steps and/or spatially separated surfaces, which have been impossible to measure with conventional shadow moirè topography. By controlling the rotation angle of the grating, spatiotemporal moirè patterns are produced with different contour intervals. The Fourier-transform technique has been applied to analyze these patterns and obtain the temporal carrier frequency, to which the height distribution of the object is related. Experimental results show the validity of this method.
Lianhua Jin, Yukitoshi Otani, Toru Yoshizawa, "Shadow moire profilometry by frequency sweeping," Optical Engineering 40(7), (1 July 2001). http://dx.doi.org/10.1117/1.1385170
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KEYWORDS
Aluminum

Light sources

Moire patterns

CCD cameras

Computing systems

Distance measurement

Fourier transforms

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