1 January 2002 New wavelet transforms for noise insensitive edge detection
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Abstract
Two new wavelet transforms for noise-insensitive edge detection are analyzed and discussed. The proposed method is useful for lead inspection of surface mount devices in the electronic industry.
© (2002) Society of Photo-Optical Instrumentation Engineers (SPIE)
Feijun Song, Suganda Jutamulia, "New wavelet transforms for noise insensitive edge detection," Optical Engineering 41(1), (1 January 2002). https://doi.org/10.1117/1.1424877 . Submission:
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