1 January 2002 New wavelet transforms for noise insensitive edge detection
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Optical Engineering, 41(1), (2002). doi:10.1117/1.1424877
Abstract
Two new wavelet transforms for noise-insensitive edge detection are analyzed and discussed. The proposed method is useful for lead inspection of surface mount devices in the electronic industry.
Feijun Song, Suganda Jutamulia, "New wavelet transforms for noise insensitive edge detection," Optical Engineering 41(1), (1 January 2002). http://dx.doi.org/10.1117/1.1424877
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KEYWORDS
Wavelet transforms

Edge detection

Wavelets

Lead

Inspection

Collimation

Bandpass filters

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