1 October 2002 Optoelectronic refractometer characterized by high sensitivity over a wide range of refractive index
Author Affiliations +
Abstract
A new design for a prism-based optoelectronic refractometer proposed earlier has been investigated. Experimental results are found to be in close agreement with theoretical calculations. For a given refractive index of the prism material, the divergence of the incident conical beam and angles of the prism determine the range of refractive index of the ambient over which the refractometer remains highly sensitive. Incident conical beams of higher divergences are found to enlarge this range. This refractometer is more robust and user-friendly than other such refractometers reported in the literature. Such a device can be useful for on-line measurements of refractive indices in process control systems.
L. M. Bali, Anchal Srivastava, Rajesh Kumar Shukla, P. Srivastava, A. Kulshreshtha, Atul Srivastava, Mahendra Kumar, "Optoelectronic refractometer characterized by high sensitivity over a wide range of refractive index," Optical Engineering 41(10), (1 October 2002). https://doi.org/10.1117/1.1503073
JOURNAL ARTICLE
9 PAGES


SHARE
RELATED CONTENT


Back to Top