1 November 2002 Beam-selector dependent on incident angle by guided-mode resonant subwavelength grating
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Optical Engineering, 41(11), (2002). doi:10.1117/1.1511531
Abstract
Guided-mode resonances in subwavelength gratings are strongly dependent on incident angles. A beam selector with high sensitivity is designed based on this property. A guided-mode resonant silicon nitride (Si3N4) grating on a silicon dioxide (SiO2) substrate is presented as an example of such a device with a 1.55 μm wavelength. The calculated reflection resonance has an incident angle FWHM of Δθ~0.0042 radians, and a normal-incident peak efficiency of ~99.9%. In addition, we propose that this type of beam selector be applied to select transverse modes of semiconductor lasers.
Ya Nie, Lei Wang, Zhiheng Wang, Chengjun Lai, "Beam-selector dependent on incident angle by guided-mode resonant subwavelength grating," Optical Engineering 41(11), (1 November 2002). http://dx.doi.org/10.1117/1.1511531
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KEYWORDS
Reflectivity

Refractive index

Silicon

Laser scattering

Scattering

Semiconductor lasers

Matrices

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