1 November 2002 Electric field-induced optical path change profiling using a Pohl interferometer
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Abstract
We describe an optical technique using the principles of a Pohl interferometer and divergent laser beams for measuring optical path changes in the spaces between interdigital electrodes. We present experimental results of the electric-field-induced optical path changes in an electrode space using a LiNbO3 sample.
© (2002) Society of Photo-Optical Instrumentation Engineers (SPIE)
Xi Yang, Lowell L. Wood, John H. Miller, "Electric field-induced optical path change profiling using a Pohl interferometer," Optical Engineering 41(11), (1 November 2002). https://doi.org/10.1117/1.1512662 . Submission:
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