1 December 2002 Evaluation of the continuous wavelet transform method for the phase measurement of electronic speckle pattern interferometry fringes
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Optical Engineering, 41(12), (2002). doi:10.1117/1.1518032
Abstract
We present an evaluation of the continuous wavelet transform method when it is used to measure the phase distribution encoded by electronic speckle pattern interferometry (ESPI) fringes. The evaluation is performed using computer-simulated fringes, an approach that allows knowing precisely the phase map contained in the pattern. It is shown that only ESPI fringes that verify the stationary phase approximation and its analytic asymptotic limit can be analyzed with the continuous wavelet transform method. The influence of the filtering process to smooth the ESPI fringes and the method used to extend the fringe pattern edges is also analyzed. Finally, additional drawbacks that emerge when this phase evaluation method is applied are discussed.
Alejandro Federico, Guillermo H. Kaufmann, "Evaluation of the continuous wavelet transform method for the phase measurement of electronic speckle pattern interferometry fringes," Optical Engineering 41(12), (1 December 2002). http://dx.doi.org/10.1117/1.1518032
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KEYWORDS
Continuous wavelet transforms

Wavelets

Wavelet transforms

Speckle

Fringe analysis

Image filtering

Speckle pattern

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