1 February 2002 Stitching interferometric measurement data for inspection of large optical components
Author Affiliations +
An algorithm for stitching together a set of individual phase measurements into a unified larger phase map is presented. The set of individual phase maps results from scanning a component over the interferometer aperture and acquiring a measurement at each position. The algorithm is based on an iterative approach, where singular value decomposition is used to solve the rigid body movement problem between the different phase maps. The algorithm has been tested in numerical experiments and has been successfully applied to real data.
© (2002) Society of Photo-Optical Instrumentation Engineers (SPIE)
Mikael Sjoedahl, Mikael Sjoedahl, Bozenko F. Oreb, Bozenko F. Oreb, "Stitching interferometric measurement data for inspection of large optical components," Optical Engineering 41(2), (1 February 2002). https://doi.org/10.1117/1.1430727 . Submission:


A stitching method to test the segments of a large...
Proceedings of SPIE (September 01 2009)
Adaptive iterative approach for image restoration
Proceedings of SPIE (September 20 1994)

Back to Top