1 May 2002 Principal Mueller matrix of reflection and scattering measured for a one-dimensional rough surface
Author Affiliations +
Optical Engineering, 41(5), (2002). doi:10.1117/1.1467359
Abstract
Reflectance R, ellipsometric parameters (?,?), depolarizations D, and cross-polarized depolarization Dv of specular reflection, and scattering by a rough stainless steel surface are measured using a null ellipsometer. The three polarization elements (Px ,Py ,Pz ) of a principal Mueller matrix are obtained from D, ?, and ?. The measured ? and ? of specular reflection for incident angle ?>70 deg are fit to the Fresnel equations to obtain n and k. The measured specular R(? ) is fit to Beckmann’s scattering theory to obtain the root mean square (rms) roughness ?. The fit ? (= 392 nm) is of the same order as the stylus measured ? (= 484 nm). The D of specular reflection is small (< 0.07). Scattering measurements are made with variable sample orientation at a detection direction 40 deg backward from the incident direction. The Dv of scattering is very small (< 0.002). The values of ?, ?, Px , Pz , and Dv of scattering are about constant for an off-specular angle (OSA) within ±60 deg and can be explained by the facet model with single scattering. The measured bidirectional reflectance distribution function (BRDF) in this region can be converted to slope angle distribution with OSA52 slope angle. The values of ?, ?, Px , Pz , and Dv of scattering deviate significantly and symmetrically from a constant level for |OSA|> 60 deg, for which the simple facet model with single scattering does not apply.
Soe-Mie F. Nee, Tsu-Wei Nee, "Principal Mueller matrix of reflection and scattering measured for a one-dimensional rough surface," Optical Engineering 41(5), (1 May 2002). http://dx.doi.org/10.1117/1.1467359
JOURNAL ARTICLE
8 PAGES


SHARE
KEYWORDS
Scattering

Polarization

Light scattering

Reflectivity

Specular reflections

Reflection

Scatter measurement

Back to Top