1 July 2002 Equivalent complex refractive indices for ray-tracing evaluation of dielectric-coated hollow waveguides
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Abstract
An idea of an equivalent refractive index for the ray tracing calculation of hollow core waveguides is proposed. A virtual, complex refractive index is uniquely found by minimizing the difference between reflectivity of a virtual monolayer material and a metal substrate coated with a dielectric film. By using this technique, transmission losses of a delivery system consisting of a hollow fiber and a tapered hollow waveguide are calculated.
© (2002) Society of Photo-Optical Instrumentation Engineers (SPIE)
Katsumasa Iwai, Yukio Abe, Yuji Matsuura, Mitsunobu Miyagi, "Equivalent complex refractive indices for ray-tracing evaluation of dielectric-coated hollow waveguides," Optical Engineering 41(7), (1 July 2002). https://doi.org/10.1117/1.1485090 . Submission:
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