1 July 2002 Structural and thermal analysis of Ag-Sb-Te alloy and its films for phase change optical memories
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Optical Engineering, 41(7), (2002). doi:10.1117/1.1481897
Abstract
An Ag-Sb-Te alloy and its films are prepared as a new optical recording amorphous crystalline (a?c) phase transformation material. The crystallization process of Ag-Sb-Te films is systematically studied through measurement of recording characteristics to solve the trade-off problem between data (amorphous) stability and erasing sensitivity. phase change optical recording disks demonstrate long thermal stability of the amorphous recording marks. The crystallization process of Ag- Sb-Te material was studied using differential thermal analysis (DTA), and the nature of the material was studied by x-ray diffraction (XRD), scanning electron microscopy (SEM), and transmission electron microscopy (TEM), respectively. The films were studied for both cases of before and after annealing. It was concluded that the alloy (Ag-Sb-Te) could be used as a phase change optical memory material.
Yagya Deva Sharma, Promod K. Bhatnagar, "Structural and thermal analysis of Ag-Sb-Te alloy and its films for phase change optical memories," Optical Engineering 41(7), (1 July 2002). http://dx.doi.org/10.1117/1.1481897
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KEYWORDS
Silver

Antimony

Crystals

Tellurium

Glasses

Annealing

X-ray diffraction

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