Augusto Garcia-Valenzuela Univ. Nacional Autonoma de Mexico (Mexico) M. Pena-Gomar Univ. Nacional Autonoma de Mexico/Instituto Nacional de Astrofisica Optica y Electronica (Mexico)
Laser reflectivity from an interface can be used to characterize, among other things, interface roughness, multilayer
structure, and optical constants. In many cases, the reflectivity has sharp features that may be more apparent in a
measurement of the angle derivative of the reflectivity.
Augusto Garcia-Valenzuela, M. Pena-Gomar, "Error analysis on measuring angle-differential profiles of optical reflectivity by dynamic reflectometry," Opt. Eng. 41(8) (1 August 2002)