1 January 2003 Deformation measurement of a micro-RF capacitive switch membrane using laser interferometry
Author Affiliations +
Abstract
We have developed a measurement method to evaluate deformation of a metallic membrane (thickness 2 μm) in a micro-radio-frequency switch. The method is based on a modified Michelson interferometer incorporated with optoelectronic devices including a He-Ne laser, conventional optics, a CCD sensor, and a photodiode. To detect the deformation of the membrane in the rf switch, a He-Ne laser probe 10 µm in diameter is directed onto the specimen. The laser beam reflected off the membrane is combined with a reference beam. The combined laser beams are regulated to follow a common path. The resulting circular interference fringe pattern is simultaneously recorded by a CCD sensor and a photodiode. The deformation of the membrane is determined from the order of the resulting fringe pattern. As demonstrated by the experimental results, the proposed method is capable of measuring deformation of the rf switch at submicron levels.
© (2003) Society of Photo-Optical Instrumentation Engineers (SPIE)
Chenggen Quan, Chenggen Quan, Shihua Wang, Shihua Wang, Cho Jui Tay, Cho Jui Tay, Ai Qun Liu, Ai Qun Liu, Huai Min Shang, Huai Min Shang, } "Deformation measurement of a micro-RF capacitive switch membrane using laser interferometry," Optical Engineering 42(1), (1 January 2003). https://doi.org/10.1117/1.1525795 . Submission:
JOURNAL ARTICLE
6 PAGES


SHARE
RELATED CONTENT

Michelson interferometer system for seismic noise measurement
Proceedings of SPIE (February 12 2004)
Space beam combiner for long-baseline interferometry
Proceedings of SPIE (April 26 1999)
Phase-Conjugate Interferometry
Proceedings of SPIE (May 22 1984)
Simplified phase-shifting holographic interferometry
Proceedings of SPIE (December 01 1993)

Back to Top