Characterization of ion-exchanged waveguides in tungsten tellurite and zinc tellurite Er<sup>3+</sup>-doped glasses

Gualtiero Nunzi Conti; Victor K. Tikhomirov; Marco Bettinelli; S. Berneschi; Massimo Brenci; Baojiu Chen; Stefano Pelli; Adolfo Speghini; Angela B. Seddon; Giancarlo C. Righini

doi:10.1117/1.1604782

1 October 2003 Characterization of ion-exchanged waveguides in tungsten tellurite and zinc tellurite Er³⁺-doped glasses

Gualtiero Nunzi Conti; Victor K. Tikhomirov; Marco Bettinelli; S. Berneschi; Massimo Brenci; Baojiu Chen; Stefano Pelli; Adolfo Speghini; Angela B. Seddon; Giancarlo C. Righini

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Optical Engineering, 42(10), (2003). doi:10.1117/1.1604782

Abstract

Among the various materials currently being investigated for further development of Er³⁺-doped waveguide amplifiers (EDWAs), tellurite glasses are gaining attention because of their broad emission band around 1.5 μm. We report our results on the fabrication of optical waveguides in two kinds of these glasses. Tungsten-tellurite and zinc-tellurite glasses containing sodium and doped with various Er₂O₃ percentages have been prepared and characterized. The Judd-Ofelt analysis was carried out on some of these glasses. Experimentally, broad emission and absorption bands corresponding to transition between ⁴I_13/2 ↔ ⁴I_15/2 were observed as expected. Lifetimes of the ⁴I_13/2 level were also measured. Ion-exchanged planar waveguides were successfully obtained in both types of glasses and characterized by the prism coupling technique; the diffusion process was investigated for the different erbium ion concentrations. All the measured characteristics indicate that both these tellurite glasses are promising for the development of broadband integrated optical amplifiers.

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Gualtiero Nunzi Conti, Victor K. Tikhomirov, Marco Bettinelli, S. Berneschi, Massimo Brenci, Baojiu Chen, Stefano Pelli, Adolfo Speghini, Angela B. Seddon, Giancarlo C. Righini, "Characterization of ion-exchanged waveguides in tungsten tellurite and zinc tellurite Er³⁺-doped glasses," Optical Engineering 42(10), (1 October 2003). https://doi.org/10.1117/1.1604782

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