1 November 2003 Determination of strains from fringe patterns using space-frequency representations
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Optical Engineering, 42(11), (2003). doi:10.1117/1.1613276
Abstract
A new approach to the retrieval of fringe pattern frequency information is introduced. In this approach, strain information is extracted from fringe patterns by using either short-time Fourier transforms or wavelets. Space-frequency representation of the fringe signals is introduced as a tool to get the space localization of the strains. The idea of spectral energy density maxima to define the instantaneous frequency (ridge points) is presented. Examples of application are given. Results show that this approach provides an excellent tool for pattern analysis.
Cesar A. Sciammarella, Taeeui Kim, "Determination of strains from fringe patterns using space-frequency representations," Optical Engineering 42(11), (1 November 2003). http://dx.doi.org/10.1117/1.1613276
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KEYWORDS
Wavelets

Fourier transforms

Fringe analysis

Wavelet transforms

Optical engineering

Signal processing

Chemical species

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