Profilometry by fringe projection

Luis Salas; Esteban Luna; Javier Salinas; Victor M. Garcia; Manuel Servin

doi:10.1117/1.1607968

1 November 2003 Profilometry by fringe projection

Luis Salas, Esteban Luna, Javier Salinas, Victor M. Garcia, Manuel Servin

Optical Engineering, Vol. 42, Issue 11, (November 2003). https://doi.org/10.1117/1.1607968

We present a method to obtain profilometry of a suitable object by fringe projection. The method is appropriate to the case of large objects as compared to the distance from the illuminating source, that is, a nonconstant equivalent wavelength. We develop an experiment to laterally displace a set of fringes on a sphere and obtain quantitative results. There are several orientation parameters involved in the method, and a minimization algorithm is developed to adjust the values of some of them. A series of numerical experiments are performed on this method to test its accuracy under various circumstances. We show that the method can currently attain precisions of ≈ λ_eq/80 (λ_eq stands for equivalent wavelength) and identify possible sources of error.

©(2003) Society of Photo-Optical Instrumentation Engineers (SPIE)

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Luis Salas, Esteban Luna, Javier Salinas, Victor M. Garcia, and Manuel Servin "Profilometry by fringe projection," Optical Engineering 42(11), (1 November 2003). https://doi.org/10.1117/1.1607968

Published: 1 November 2003

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