1 November 2003 Profilometry by fringe projection
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Optical Engineering, 42(11), (2003). doi:10.1117/1.1607968
Abstract
We present a method to obtain profilometry of a suitable object by fringe projection. The method is appropriate to the case of large objects as compared to the distance from the illuminating source, that is, a nonconstant equivalent wavelength. We develop an experiment to laterally displace a set of fringes on a sphere and obtain quantitative results. There are several orientation parameters involved in the method, and a minimization algorithm is developed to adjust the values of some of them. A series of numerical experiments are performed on this method to test its accuracy under various circumstances. We show that the method can currently attain precisions of ≈ λeq/80 (λeq stands for equivalent wavelength) and identify possible sources of error.
Luis Salas, Esteban Luna, Javier Salinas, Victor M. Garcia, Manuel Servin, "Profilometry by fringe projection," Optical Engineering 42(11), (1 November 2003). http://dx.doi.org/10.1117/1.1607968
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KEYWORDS
Optical spheres

Sensors

Mirrors

Projection systems

Image segmentation

Optical engineering

Interferometry

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