1 November 2003 Profilometry by fringe projection
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Abstract
We present a method to obtain profilometry of a suitable object by fringe projection. The method is appropriate to the case of large objects as compared to the distance from the illuminating source, that is, a nonconstant equivalent wavelength. We develop an experiment to laterally displace a set of fringes on a sphere and obtain quantitative results. There are several orientation parameters involved in the method, and a minimization algorithm is developed to adjust the values of some of them. A series of numerical experiments are performed on this method to test its accuracy under various circumstances. We show that the method can currently attain precisions of ≈ λeq/80 (λeq stands for equivalent wavelength) and identify possible sources of error.
© (2003) Society of Photo-Optical Instrumentation Engineers (SPIE)
Luis Salas, Luis Salas, Esteban Luna, Esteban Luna, Javier Salinas, Javier Salinas, Victor M. Garcia, Victor M. Garcia, Manuel Servin, Manuel Servin, } "Profilometry by fringe projection," Optical Engineering 42(11), (1 November 2003). https://doi.org/10.1117/1.1607968 . Submission:
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