1 December 2003 Position-invariant surface recognition and localization using infrared sensors
Author Affiliations +
Optical Engineering, 42(12), (2003). doi:10.1117/1.1621005
Low-cost infrared emitters and detectors are used for the recognition of surfaces with different properties in a location-invariant manner. The intensity readings obtained with such devices are highly dependent on the location and properties of the surface in a way that cannot be represented in a simple manner, complicating the recognition and localization process. We propose the use of angular intensity scans and present an algorithm to process them. This approach can distinguish different surfaces independently of their positions. Once the surface is identified, its position can also be estimated. The method is verified experimentally with the surfaces aluminum, white painted wall, brown kraft paper, and polystyrene foam packaging material. A correct differentiation rate of 87% is achieved, and the surfaces are localized within absolute range and azimuth errors of 1.2 cm and 1.0 deg, respectively. The method demonstrated shows that simple infrared sensors, when coupled with appropriate processing, can be used to extract a significantly greater amount of information than they are commonly employed for.
Billur Barshan, Tayfun Aytac, "Position-invariant surface recognition and localization using infrared sensors," Optical Engineering 42(12), (1 December 2003). http://dx.doi.org/10.1117/1.1621005

Infrared sensors


Error analysis




Infrared radiation


Human occupancy detection
Proceedings of SPIE (October 06 1994)
Opto-mechanical design of SCUBA-2
Proceedings of SPIE (July 06 2006)
Resolution Limitations In Photothermal Radiometric Imaging
Proceedings of SPIE (October 03 1988)
Space Interferometry Mission (SIM) thermal design
Proceedings of SPIE (February 26 2003)

Back to Top