1 May 2003 Absolute phase analysis method for three-dimensional surface profilometry using frequency-modulated grating
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Optical Engineering, 42(5), (2003). doi:10.1117/1.1566780
Abstract
The authors propose a new high-speed and accurate phase analysis and subsequent phase unwrapping method for grating projection surface profilometry. In the proposed method, a special grating pattern is used for the projection. The light intensity distribution of this grating pattern has a form of a frequency modulated sinusoidal wave. In this grating pattern, two different phase distributions are included. The frequency modulated grating, which can be generated with an LCD projector or a film projector easily, is projected onto an object. Then, nine frames with phase stepping at a regular interval for a cycle are taken by a CCD camera. From these nine pictures, the two wrapped phase distributions are analyzed simultaneously. Then, using these phase distributions, phase unwrapping is carried out at each pixel independently. The 3-D profile of the object can be reconstructed using the absolute phase distribution. Since this method is suitable for high-speed shape measurement, applications to various inspections and 3-D surface digitizing are expected.
Yasuyuki Ikeda, Satoru Yoneyama, Motoharu Fujigaki, Yoshiharu Morimoto, "Absolute phase analysis method for three-dimensional surface profilometry using frequency-modulated grating," Optical Engineering 42(5), (1 May 2003). http://dx.doi.org/10.1117/1.1566780
JOURNAL ARTICLE
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KEYWORDS
Projection systems

CCD cameras

Calibration

Error analysis

Optical engineering

Cameras

LCDs

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