1 June 2003 Planar pattern for automatic camera calibration
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Optical Engineering, 42(6), (2003). doi:10.1117/1.1574037
Abstract
We present a method for automatic camera calibration that requires only that a planar pattern be visible by the camera from a few (at least three) different views. A major issue is how to obtain the projection of an absolute point using the planar pattern. In the calibration, we can move either the camera or the planar pattern and no knowledge about the motion is required. We consider and resolve both linear and nonlinear parameters. In testing the proposed methods, satisfactory results are achieved in the simulation and in real data experiments.
B. Zhang, Youfu Li, Fuchao Wu, "Planar pattern for automatic camera calibration," Optical Engineering 42(6), (1 June 2003). http://dx.doi.org/10.1117/1.1574037
JOURNAL ARTICLE
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KEYWORDS
Cameras

Calibration

Distortion

Lithium

Optical engineering

Computer simulations

Curium

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