Calculation and measurement of infrared mass extinction coefficients of selected ionic and partially ionic insulators and semiconductors: a guide for infrared obscuration applications

Paul G. Appleyard; Nigel Davies

doi:10.1117/1.1637904

1 February 2004 Calculation and measurement of infrared mass extinction coefficients of selected ionic and partially ionic insulators and semiconductors: a guide for infrared obscuration applications

Paul G. Appleyard, Nigel Davies

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Optical Engineering, Vol. 43, Issue 2, (February 2004). https://doi.org/10.1117/1.1637904

IR extinction cross sections and mass extinction coefficients of micrometer-sized particles of a variety of polar or partly polar insulators and semiconductors are calculated using several single-particle electromagnetic scattering models including the well-established Mie theory for homogeneous spheres and more modern techniques such as the T matrix method. The range of scattering models employed enable a detailed investigation of the impact of particle morphology on IR extinction. Aerosol chamber measurements of the mass extinction coefficients of a selection of particulate materials are also made and compared with the theoretical calculations. Distinct extinction characteristics in the mid- and far-IR corresponding to reststrahlen band dispersions in the optical constants were predicted and observed. The results indicate the potential limitations of this class of material as military IR obscurants.

©(2004) Society of Photo-Optical Instrumentation Engineers (SPIE)

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Paul G. Appleyard and Nigel Davies "Calculation and measurement of infrared mass extinction coefficients of selected ionic and partially ionic insulators and semiconductors: a guide for infrared obscuration applications," Optical Engineering 43(2), (1 February 2004). https://doi.org/10.1117/1.1637904

Published: 1 February 2004

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