New hyperspectral discrimination measure for spectral characterization

Yingzi Du; Chein-I Chang; Hsuan Ren; Chein-Chi Chang; James O. Jensen; Francis M. D'Amico

doi:10.1117/1.1766301

1 August 2004 New hyperspectral discrimination measure for spectral characterization

Yingzi Du, Chein-I Chang, Hsuan Ren, Chein-Chi Chang, James O. Jensen, Francis M. D'Amico

Author Affiliations +

Optical Engineering, Vol. 43, Issue 8, (August 2004). https://doi.org/10.1117/1.1766301

Abstract

The spectral angle mapper (SAM) has been widely used in multispectral and hyperspectral image analysis to measure spectral similarity between substance signatures for material identification. It has been shown that the SAM is essentially the Euclidean distance when the spectral angle is small. Most recently, a stochastic measure, called the spectral information divergence (SID), has been suggested to model the spectrum of a hyperspectral image pixel as a probability distribution, so that spectral variations among spectral bands can be captured more effectively in a stochastic manner. This paper develops a new hyperspectral spectral discrimination measure, which combines the SID and the SAM into a mixed measure. More specifically, let r and r′ denote two hyperspectral image pixel vectors with their corresponding spectra specified by s and s′. Then SAM(s,s′) measures the spectral angle between s and s′. Similarly, SID(s,s′) measures the information divergence between the probability distributions generated by s and s. The proposed new measure, referred to as the SID-SAM mixed measure, can be implemented in two versions, given by SID(s,s′)×tan(SAM(s,s′)) and SID(s,s′)×sin(SAM(s,s′)), where tan and sin are the usual trigonometric functions. The spectral discriminability of such a mixed measure is greatly enhanced by multiplying the spectral abilities of the two measures. In order to demonstrate its utility, a comparative study is conducted among the SID-SAM mixed measure, the SID, and the SAM. Our experimental results have shown that the discriminatory ability of the (SID,SAM) mixed measure can be a significant improvement over the SID and SAM.

©(2004) Society of Photo-Optical Instrumentation Engineers (SPIE)

Citation Download Citation

Yingzi Du, Chein-I Chang, Hsuan Ren, Chein-Chi Chang, James O. Jensen, and Francis M. D'Amico "New hyperspectral discrimination measure for spectral characterization," Optical Engineering 43(8), (1 August 2004). https://doi.org/10.1117/1.1766301

Published: 1 August 2004

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available