1 October 2004 Optical vector network analysis based on single-sideband modulation
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We investigate an optical vector network analysis technique based on optical single-sideband modulation that can provide spectral characterization of optical components in terms of amplitude and phase shift with femtometer wavelength resolution. The fundamentals of the system are analyzed and a mathematical model for the measurement process is derived. Using this model and experimental results, the potential of the technique in terms of frequency resolution is demonstrated. However, it is also found that the measurement accuracy relies on a high suppression of the residual sideband in the optical single-sideband modulation deployed.
© (2004) Society of Photo-Optical Instrumentation Engineers (SPIE)
Rubén Hernández, Rubén Hernández, Alayn Loayssa, Alayn Loayssa, David Benito, David Benito, } "Optical vector network analysis based on single-sideband modulation," Optical Engineering 43(10), (1 October 2004). https://doi.org/10.1117/1.1788691 . Submission:

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