1 December 2004 Measurement of ion-exchanged waveguide burial depth with a camera
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Optical Engineering, 43(12), (2004). doi:10.1117/1.1814364
Abstract
We present a novel method of measuring the depth of a mode for a buried ion-exchanged channel waveguide in glass while simultaneously measuring its near-field mode profile. The method is simple to implement and can be used without removing the sample from a standard waveguide characterization system. Experimental results for surface and buried Ag+/Na+ exchanged waveguides are presented. It is demonstrated that the depth of a mode can be determined with an uncertainty of ±0.2 µm.
Jesse A. Frantz, James Carriere, Raymond K. Kostuk, "Measurement of ion-exchanged waveguide burial depth with a camera," Optical Engineering 43(12), (1 December 2004). http://dx.doi.org/10.1117/1.1814364
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KEYWORDS
Waveguides

Waveguide modes

Glasses

Point spread functions

Ion exchange

Cameras

Near field

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