1 March 2004 Grazing angle enhanced backscattering from a dielectric film on a reflecting metal substrate
Author Affiliations +
Optical Engineering, 43(3), (2004). doi:10.1117/1.1646410
Abstract
We have recently observed several features from a randomly rough dielectric film on a reflecting metal substrate including a change in the spectrum of light at the satellite peaks, the high-order correlation, and enhanced backscattering from the grazing angle. In this paper, we focus on the enhanced backscattering phenomena. The backscattering signal at small grazing angles is very important for vehicle re-entrance and subsurface radar sensing applications. Recently, we performed an experimental study of far-field scattering at small grazing angles, especially enhanced backscattering at grazing angles. For a randomly weak, rough dielectric film on a reflecting metal substrate, a much larger enhanced backscattering peak is measured. Experimental results are compared with theoretical predictions based on a two-scale surface roughness scattering model.
Zu-Han Gu, Iosif M. Fuks, Mikael Ciftan, "Grazing angle enhanced backscattering from a dielectric film on a reflecting metal substrate," Optical Engineering 43(3), (1 March 2004). https://doi.org/10.1117/1.1646410
JOURNAL ARTICLE
9 PAGES


SHARE
Back to Top