1 May 2004 Method of characterization of effective shrinkage in reflection holograms
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Optical Engineering, 43(5), (2004). doi:10.1117/1.1666743
Abstract
A method is described to evaluate plane-wave volume hologram fringe inclination and spacing, as well as the recording material average refraction index. This evaluation allows us to estimate changes in the hologram parameters due to recording material shrinkage. The method is based on measurements of the incident and diffracted beam Bragg angles for two different wavelengths. The conditions for minimizing measurement errors are obtained. The experimental data are in good agreement with the calculated data.
Pavel V Trochtchanovitch, Nikolai A. Kostrov, Emin H. Goulanian, Faouzi Zerrouk, Eugene F. Pen, Vladimir V. Shelkovnikov, "Method of characterization of effective shrinkage in reflection holograms," Optical Engineering 43(5), (1 May 2004). http://dx.doi.org/10.1117/1.1666743
JOURNAL ARTICLE
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KEYWORDS
Holograms

Refractive index

Reflection

Volume holography

Holographic materials

Holography

Optical engineering

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