1 July 2004 High-resolution and easily implemented spectral measured system used for optical characterization of optoelectronic materials and devices
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Optical Engineering, 43(7), (2004). doi:10.1117/1.1755718
Abstract
We set up a compact high-resolution linear charge-coupled-device (CCD)-based spectrometer for the characterization of optoelectronic materials and devices. The spectrometer is controlled by a personal computer. Detailed design diagrams of the mechanical structure and electronic hardware are described. Spectral resolution of the CCD measurement system of ~0.7 Å/pixel is determined from spectral calibration using two laser sources. Electroluminescent measurements of several selective optoelectronic components, as well as the transmission measurements of GaSe and GaSe0.9S0.1 layered semiconductors, are performed utilizing the new spectrometer. The experimental results are analyzed and discussed.
Ching-Hwa Ho, Horng-Wen Lee, "High-resolution and easily implemented spectral measured system used for optical characterization of optoelectronic materials and devices," Optical Engineering 43(7), (1 July 2004). https://doi.org/10.1117/1.1755718
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