New approach to the measurement of refractive index

L. M. Bali; Rajesh Kumar Shukla; Priyanka Srivastava; Anchal Srivastava; Atul Srivastava; A. Kulshreshtha

doi:10.1117/1.1900090

1 May 2005 New approach to the measurement of refractive index

L. M. Bali, Rajesh Kumar Shukla, Priyanka Srivastava, Anchal Srivastava, Atul Srivastava, A. Kulshreshtha

Author Affiliations +

Optical Engineering, Vol. 44, Issue 5, 058002 (May 2005). https://doi.org/10.1117/1.1900090

Abstract

A new approach for the measurement of a refractive index is presented, following the introduction of a novel feature based on the selection of a large number of angles of incidence along a direction of symmetry at the prism-ambient interface, without moving the incident beam. This gives rise to very high sensitivities over a refractive index range determined by the divergence of this beam.

©(2005) Society of Photo-Optical Instrumentation Engineers (SPIE)

Citation Download Citation

L. M. Bali, Rajesh Kumar Shukla, Priyanka Srivastava, Anchal Srivastava, Atul Srivastava, and A. Kulshreshtha "New approach to the measurement of refractive index," Optical Engineering 44(5), 058002 (1 May 2005). https://doi.org/10.1117/1.1900090

Published: 1 May 2005

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available