1 April 2005 Two-period interference fringes interferometry
Author Affiliations +
Optical Engineering, 44(4), 045601 (2005). doi:10.1117/1.1883697
Abstract
A novel measuring method, two-period interference fringes interferometry, is described. The principle of this method is different from that of the two-wavelength interferometry that is widely known. Two interference fringes, with a little difference between their spatial periods, are obtained by turning a binary step grating and produce a synthetic equivalent period much longer than either of the two periods. The interference fringes are produced by the ±first-order beams diffracted from the grating. The intensity distribution of the interference pattern is independent of the wavelength of the laser-diode light source used. The measuring range of this method is much larger than that of the two-wavelength interferometery. A sinusoidal phase modulating technique is easily applied to detect the phase distribution of interference pattern by vibrating the grating sinusoidally. The plane reflector of ~3 mm thickness is measured to verify this novel method.
Yande Xu, "Two-period interference fringes interferometry," Optical Engineering 44(4), 045601 (1 April 2005). http://dx.doi.org/10.1117/1.1883697
JOURNAL ARTICLE
6 PAGES


SHARE
KEYWORDS
Interferometry

Phase measurement

Light sources

CCD image sensors

Modulation

Optical engineering

Reflectors

Back to Top