1 August 2005 Real-time phase shift schlieren
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Optical Engineering, 44(8), 083603 (2005). doi:10.1117/1.2032307
Abstract
The phase shift schlieren (PSS), an improved method of the conventional schlieren imaging technique, enables direct quantitative measurements of optical path length gradients. Like all phase-shifting imaging methods, a successive acquisition of multiple images is required, therefore limiting the PSS use to quasi-steady-state phenomena. We show that PSS can be easily modified to access real-time data. A possible implementation is disclosed, as well as experimental results that validate the method. An application on gas jet is illustrated. We present the features and limitations of the real-time phase shift schlieren (RTPSS).
Sébastien Farinotti, Didier Beghuin, Luc C. Joannes, "Real-time phase shift schlieren," Optical Engineering 44(8), 083603 (1 August 2005). http://dx.doi.org/10.1117/1.2032307
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KEYWORDS
Phase shifts

Seaborgium

Image sensors

Sensors

Diffraction

Diffraction gratings

Imaging systems

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