Full-field phase measurement by wavelength-tuning interferometry in the C-band

Patrick Egan; Fereyduon Lakestani; Maurice Patrick Whelan; Michael J. Connelly

doi:10.1117/1.2401169

1 December 2006 Full-field phase measurement by wavelength-tuning interferometry in the C-band

Patrick Egan, Fereyduon Lakestani, Maurice Patrick Whelan, Michael J. Connelly

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Optical Engineering, Vol. 45, Issue 12, 120504 (December 2006). https://doi.org/10.1117/1.2401169

Abstract

Fluctuations in the output intensity and wavelength of an external cavity diode laser can introduce significant error to wavelength-tuned interferometric measurement. However, a robust phase-retrieval algorithm can compensate for these nonlinearities. Employing an inexpensive phosphor-coated charge-coupled device camera sensitive to C-band infrared, full-field interferometric phase retrieval utilizing wavelength tuning of a 1555 nm external cavity diode laser is reported. Phase measurement of a tilted mirror is presented with an estimated accuracy within 7 nm.

©(2006) Society of Photo-Optical Instrumentation Engineers (SPIE)

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Patrick Egan, Fereyduon Lakestani, Maurice Patrick Whelan, and Michael J. Connelly "Full-field phase measurement by wavelength-tuning interferometry in the C-band," Optical Engineering 45(12), 120504 (1 December 2006). https://doi.org/10.1117/1.2401169

Published: 1 December 2006

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