1 February 2006 Optical thickness and anisotropic orientation of a birefringent thin film: analysis from explicit expressions for reflection and transmission coefficients
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Optical Engineering, 45(2), 023802 (2006). doi:10.1117/1.2173673
Abstract
We present explicit expressions for the reflection and transmission coefficients of an anisotropic thin film. In the general case, the optical axis and the incident ray are in arbitrary directions. Multireflected ordinary rays and extraordinary rays in the thin film are coupled to each other at the interface. The degrees of polarization conversion for reflected and transmitted light from the anisotropic thin film are calculated. The transmittance and reflectance are measured by rotating the polarization of the normal incident ray, and the columnar growth plane and film thickness are thus determined.
Yi-Jun Jen, Cheng-Lung Chiang, "Optical thickness and anisotropic orientation of a birefringent thin film: analysis from explicit expressions for reflection and transmission coefficients," Optical Engineering 45(2), 023802 (1 February 2006). http://dx.doi.org/10.1117/1.2173673
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KEYWORDS
Thin films

Polarization

Reflection

Reflectivity

Refractive index

Interfaces

Geometrical optics

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