1 March 2006 Optical characterization of Ag–Sb–Te chalcogenide thin films
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Optical Engineering, 45(3), 033801 (2006). doi:10.1117/1.2181586
Abstract
A systematic investigation of AgxSb2(1–x)Te3(1–x) (x=0.16, 0.18, and 0.20) is reported. The optical properties of the material were studied using a UV spectrophotometer. The optical behavior of a material is generally utilized to determine its optical constants such as reflectance, transmittance, and optical band gap E0. The value of E0 is estimated for these samples by measuring the absorption coefficient as a function of the wavelength of light in the range 300 to 1400 nm. Films of different Ag content were studied both before and after annealing. It was concluded that this material is a candidate for phase change optical memory.
Yagyadeva D. Sharma, Promod K. Bhatnagar, "Optical characterization of Ag–Sb–Te chalcogenide thin films," Optical Engineering 45(3), 033801 (1 March 2006). http://dx.doi.org/10.1117/1.2181586
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KEYWORDS
Silver

Antimony

Tellurium

Reflectivity

Transmittance

Thin films

Chalcogenides

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