Further improvement of edge location accuracy of charge-coupled-device laser autocollimators using orthogonal Fourier-Mellin moments

Jiubin Tan; Lei Ao; Ji-wen Cui; Wen-jing Kang

doi:10.1117/1.2735287

1 May 2007 Further improvement of edge location accuracy of charge-coupled-device laser autocollimators using orthogonal Fourier-Mellin moments

Jiubin Tan, Lei Ao, Ji-wen Cui, Wen-jing Kang

Author Affiliations +

Optical Engineering, Vol. 46, Issue 5, 057007 (May 2007). https://doi.org/10.1117/1.2735287

Abstract

In order to further improve edge location accuracies of charge-coupled-device laser autocollimators, we use rotation invariance and lower radial orders of orthogonal Fourier-Mellin moments to efficiently extract the characteristics of edges, set the edges in the vertical direction, and establish the expressions used for edge location. We accomplish this by analyzing the interrelationship of orthogonal Fourier-Mellin moments. We compensate errors caused by the differences between the masks selected (by correcting the locations in proportion to the dimensions of the masks selected) and by the differences between actual and ideal edge patterns (by correcting the bias errors in proportion to the distance from the center of the sampling area to the edge). Experimental results show that an edge location accuracy of 0.06 pixel can be achieved for straight lines, 0.08 pixel for curves, and ±0.12 pixel for an actual circular target acquired by a charge-coupled-device laser autocollimator. It is therefore concluded that the proposed method can be used as an efficient approach to achieve the higher edge location accuracies specified for such optoelectronic image measurements instruments as a charge-coupled-device laser autocollimator.

©(2007) Society of Photo-Optical Instrumentation Engineers (SPIE)

Citation Download Citation

Jiubin Tan, Lei Ao, Ji-wen Cui, and Wen-jing Kang "Further improvement of edge location accuracy of charge-coupled-device laser autocollimators using orthogonal Fourier-Mellin moments," Optical Engineering 46(5), 057007 (1 May 2007). https://doi.org/10.1117/1.2735287

Published: 1 May 2007

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