Accurate subpixel corner detection on planar camera calibration targets

Paulo da Silva Tavares; Mario A. P. Vaz

doi:10.1117/1.2790926

1 October 2007 Accurate subpixel corner detection on planar camera calibration targets

Paulo da Silva Tavares, Mario A. P. Vaz

Author Affiliations +

Optical Engineering, Vol. 46, Issue 10, 107205 (October 2007). https://doi.org/10.1117/1.2790926

Abstract

Feature detectors have long been one of the touchstones of image processing. Most vision tasks are entirely dependent on the accurate determination of fiducial marks on images, which ultimately led to a quest for methods able to detect feature locations with high resolution. We report the development of an intensity-based subpixel corner detector based on the two-dimensional (2-D) Hilbert transform. Extensive testing of both accuracy and precision with live images finds the method adequate for subpixel detection at better than 10^-1 pixel accuracy. The subpixel corner detectors and the evaluation proposals to date are briefly reviewed, and the proposed method is described. The results are shown and discussed.

©(2007) Society of Photo-Optical Instrumentation Engineers (SPIE)

Citation Download Citation

Paulo da Silva Tavares and Mario A. P. Vaz "Accurate subpixel corner detection on planar camera calibration targets," Optical Engineering 46(10), 107205 (1 October 2007). https://doi.org/10.1117/1.2790926

Published: 1 October 2007

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