1 November 2007 Flaw detection using lock-in temporal speckle pattern interferometry and thermal waves
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Optical Engineering, 46(11), 115601 (2007). doi:10.1117/1.2801725
Abstract
This paper presents the evaluation of a removal method to cancel the thermal convection effect that is generated in vertically positioned metal plates loaded by thermal waves when a lock-in temporal speckle pattern interferometry technique is used to detect hidden flaws. Additionally, the resolution of this technique to detect two nearby flaws is also analyzed.
Andrés E. Dolinko, Guillermo H. Kaufmann, "Flaw detection using lock-in temporal speckle pattern interferometry and thermal waves," Optical Engineering 46(11), 115601 (1 November 2007). http://dx.doi.org/10.1117/1.2801725
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KEYWORDS
Convection

Thermal effects

Speckle pattern

Interferometry

Modulation

Spectral resolution

Lamps

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