1 December 2007 All-in-one measurement setup for fast and accurate linear characterization of guided-wave optical devices
Author Affiliations +
Abstract
We present an all-in-one, computer-controlled, measurement setup able to evaluate propagation losses, effective group index, and mode size of integrated optical devices and optical fibers. The possibility to use a single setup, instead of three separate ones, enables faster measurements, improvements in terms of reproducibility and precision, and reduction of systematic errors. Control of the operating conditions, easier system upgrade besides cost and laboratory space savings are other additional features of this system. To confirm proper operation and versatility of the proposed setup, different samples are successfully characterized, and results are presented and discussed.
© (2007) Society of Photo-Optical Instrumentation Engineers (SPIE)
Davide Castaldini, Paolo Bassi, Sorin Tascu, Greg Sauder, Pierre Aschieri, Marc P. De Micheli, Pascal A. Baldi, Krishna Thyagarajan, Mangalpady R. Shenoy, "All-in-one measurement setup for fast and accurate linear characterization of guided-wave optical devices," Optical Engineering 46(12), 124601 (1 December 2007). https://doi.org/10.1117/1.2821860 . Submission:
JOURNAL ARTICLE
9 PAGES


SHARE
Back to Top