1 February 2008 On-line submicron profile measurements from safe distances with conoscopic holography: feasibility and potential problems
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Optical Engineering, 47(2), 023602 (2008). doi:10.1117/1.2844713
Abstract
On-line noncontact surface inspection with high precision is still an open problem. Usual methods are, in general, not applicable in hostile environments or not adequate for on-line measurement, as they are either slow in nature or need to work from very short, unsafe distances, providing small depths of field and apertures. The ongoing work toward the development of a noncontact optical profile measuring sensor that could be used for submicron measurements in on-line applications is presented here. Our approach is based on conoscopic holography and triangulation, and uses a very simple method for removing speckle noise, which is key for obtaining high precisions from safe distances (several centimeters).
Ignacio Alvarez, Jose María Enguita, Jorge Marina, Cesar Fraga Bobis, "On-line submicron profile measurements from safe distances with conoscopic holography: feasibility and potential problems," Optical Engineering 47(2), 023602 (1 February 2008). http://dx.doi.org/10.1117/1.2844713
JOURNAL ARTICLE
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KEYWORDS
Speckle

Distance measurement

Holography

Diffusers

Crystals

Sensors

Inspection

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